IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sliced Wasserstein Kernels for Probability Distributions

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Soheil Kolouri ; Yang Zou ; Gustavo K. Rohde
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 5,258 - 5,267
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.568
Regular:

Optimal transport distances, otherwise known as Wasserstein distances, have recently drawn ample attention in computer vision and machine learning as powerful discrepancy measures for probability... View More

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