IEEE - Institute of Electrical and Electronics Engineers, Inc. - Similarity Metric for Curved Shapes in Euclidean Space

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Girum G. Demisse ; Djamila Aouada ; Bjorn Ottersten
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 5,042 - 5,050
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.545
Regular:

In this paper, we introduce a similarity metric for curved shapes that can be described, distinctively, by ordered points. The proposed method represents a given curve as a point in the... View More

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