IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Reflectance Maps

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Konstantinos Rematas ; Tobias Ritschel ; Mario Fritz ; Efstratios Gavves ; Tinne Tuytelaars
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 4,508 - 4,516
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.488
Regular:

Undoing the image formation process and therefore decomposing appearance into its intrinsic properties is a challenging task due to the under-constrained nature of this inverse problem. While... View More

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