IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Light Field Depth Estimation for Noisy Scene with Occlusion

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): W. Williem ; In Kyu Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 4,396 - 4,404
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.476
Regular:

Light field depth estimation is an essential part of many light field applications. Numerous algorithms have been developed using various light field characteristics. However, conventional methods... View More

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