IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning from the Mistakes of Others: Matching Errors in Cross-Dataset Learning

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Viktoriia Sharmanska ; Novi Quadrianto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 3,967 - 3,975
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.430
Regular:

Can we learn about object classes in images by looking at a collection of relevant 3D models? Or if we want to learn about human (inter-)actions in images, can we benefit from videos or abstract... View More

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