IEEE - Institute of Electrical and Electronics Engineers, Inc. - Macroscopic Interferometry: Rethinking Depth Estimation with Frequency-Domain Time-of-Flight

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Achuta Kadambi ; Jamie Schiel ; Ramesh Raskar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 893 - 902
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.103
Regular:

A form of meter-scale, macroscopic interferometry is proposed using conventional time-of-flight (ToF) sensors. Today, ToF sensors use phase-based sampling, where the phase delay between emitted... View More

Advertisement