IEEE - Institute of Electrical and Electronics Engineers, Inc. - Needle-Match: Reliable Patch Matching under High Uncertainty

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Or Lotan ; Michal Irani
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 439 - 448
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.54
Regular:

Reliable patch-matching forms the basis for many algorithms (super-resolution, denoising, inpainting, etc.) However, when the image quality deteriorates (by noise, blur or geometric distortions),... View More

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