IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Relaxed Deep Supervision for Better Edge Detection

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Yu Liu ; Michael S. Lew
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 231 - 240
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.32
Regular:

We propose using relaxed deep supervision (RDS) within convolutional neural networks for edge detection. The conventional deep supervision utilizes the general groundtruth to guide intermediate... View More

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