IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast Detection of Curved Edges at Low SNR

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Nati Ofir ; Meirav Galun ; Boaz Nadler ; Ronen Basri
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 213 - 221
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.30
Regular:

Detecting edges is a fundamental problem in computer vision with many applications, some involving very noisy images. While most edge detection methods are fast, they perform well only on... View More

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