IEEE - Institute of Electrical and Electronics Engineers, Inc. - Joint Probabilistic Matching Using m-Best Solutions

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): Seyed Hamid Rezatofighi ; Anton Milani ; Zhen Zhang ; Qinfeng Shi ; Anthony Dick ; Ian Reid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 27 June 2016
Page(s): 136 - 145
ISBN (Electronic): 978-1-4673-8851-1
ISSN (Electronic): 1063-6919
DOI: 10.1109/CVPR.2016.22
Regular:

Matching between two sets of objects is typically approached by finding the object pairs that collectively maximize the joint matching score. In this paper, we argue that this single solution does... View More

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