IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulate the effect of trapped charges and trap cross-section on aging process

2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Author(s): Hisham A. Alghamdi ; George Chen ; Alun Vaughan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Toronto, ON, Canada
Conference Date: 16 October 2016
Page(s): 27 - 30
ISBN (Electronic): 978-1-5090-4654-6
ISBN (USB): 978-1-5090-4653-9
DOI: 10.1109/CEIDP.2016.7785678
Regular:

The developed DC space-charge life model has been used to investigate the effect of trap cross-sections and trapped charges on the aging process in polymers. The experiment was performed using a... View More

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