IEEE - Institute of Electrical and Electronics Engineers, Inc. - PD activity in void type dielectric samples for varied DC polarity

2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Author(s): Edward Corr ; W. H. Siew ; Weijia Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Toronto, ON, Canada
Conference Date: 16 October 2016
Page(s): 510 - 513
ISBN (Electronic): 978-1-5090-4654-6
ISBN (USB): 978-1-5090-4653-9
DOI: 10.1109/CEIDP.2016.7785616
Regular:

This paper discusses the DC testing of a dielectric sample (with voids) under DC conditions. The ramp test method was employed to assess whether the tests were repeatable. Three DC ramp tests were... View More

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