IEEE - Institute of Electrical and Electronics Engineers, Inc. - Polarized Relay Contacts Gap Measurement Based on Machine Vision Technology

2016 Sixth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)

Author(s): Hao Chen ; Xueting Hu ; Rao Fu ; Ruichao Wang ; Huimin Liang ; Haidan Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2016
Conference Location: Harbin, China
Conference Date: 21 July 2016
Page(s): 623 - 628
ISBN (CD): 978-1-5090-1194-0
ISBN (Electronic): 978-1-5090-1195-7
DOI: 10.1109/IMCCC.2016.237
Regular:

Assembly consistency of relay contact system is one of the key factors which affects the consistency of the polarized relays of the same batch. Gap length of relay contacts is an important... View More

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