IEEE - Institute of Electrical and Electronics Engineers, Inc. - HASS Rapid Change-Over Process

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR)

Author(s): Derik Clayton ; Julie Stuckey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Pensacola Beach, FL, USA
Conference Date: 28 September 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-1880-2
DOI: 10.1109/ASTR.2016.7762268
Regular:

A significant increase in HASS testing demand drove the necessity for process improvement to reduce traditional set-up times. Multiple part numbers are undergoing HASS testing at the manufacturing... View More

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