IEEE - Institute of Electrical and Electronics Engineers, Inc. - Generating single-stuck-fault coverage from a collapsed-fault set

Author(s): M.A. Heap ; W.A. Rogers
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1989
Volume: 22
Page Count: 7
Page(s): 51 - 57
ISSN (Paper): 0018-9162
DOI: 10.1109/2.25382
Regular:

Fault simulators do not simulate all the single stuck faults (SSFs), because as the simulated fault set grows, the increase in their runtime and memory requirements is greater than linear.... View More

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