IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experiment on the absolute measurement of a silicon lattice spacing at the NRLM

Author(s): M. Tanaka ; K. Nakayama ; K. Kuroda
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1989
Volume: 38
Page Count: 4
Page(s): 206 - 209
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.192273
Regular:

An experimental setup for the determination of the silicon lattice constant is described. The monolithic flexure hinge mechanisms for orientation adjustment, an optical interferometer for angle... View More

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