IEEE - Institute of Electrical and Electronics Engineers, Inc. - Complete recovery of light induced degradation of Cz silicon solar cells with rapid thermal processing

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)

Author(s): Veysel Unsur ; Babar Hussain ; Aba Ebong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Portland, OR, USA
Conference Date: 5 June 2016
Page(s): 717 - 719
ISBN (Electronic): 978-1-5090-2724-8
DOI: 10.1109/PVSC.2016.7749695
Regular:

This paper reports on the use of rapid thermal processing (RTP) IR belt furnace to completely and permanently regenerate the effective minority carrier lifetime in Czochralski (Cz) crystalline... View More

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