IEEE - Institute of Electrical and Electronics Engineers, Inc. - Coupling Simulation for electrical resistance tomography

2016 IEEE International Conference on Imaging Systems and Techniques (IST)

Author(s): Jiamin Ye ; Meng Wu ; Hanqiao Che ; Haigang Wang ; Wuqaing Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chania, Greece
Conference Date: 4 October 2016
Page(s): 289 - 293
ISBN (Electronic): 978-1-5090-1817-8
DOI: 10.1109/IST.2016.7738239
Regular:

The performance of electrical resistance tomography (ERT) system is usually investigated by numerical simulation or static tests using some simple phantoms. The objective of this paper is to... View More

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