IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the radiated susceptibility of a transmission line under near and far-field conditions

2016 International Symposium on Electromagnetic Compatibility (EMC EUROPE)

Author(s): Zhao Zhao ; Marco Leone
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Wroclaw, Poland
Conference Date: 5 September 2016
Page(s): 889 - 893
ISBN (Electronic): 978-1-5090-1416-3
ISBN (USB): 978-1-5090-1415-6
ISSN (Electronic): 2325-0364
DOI: 10.1109/EMCEurope.2016.7739234
Regular:

An analytical transmission line (TL) coupling model is used for evaluating the susceptibility of a DUT in the near-field of a noise source in comparison to a far-field excitation. For this... View More

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