IEEE - Institute of Electrical and Electronics Engineers, Inc. - Finding Glitches Using Formal Methods

2016 22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC)

Author(s): Yan Peng ; Ian W. Jones ; Mark R. Greenstreet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2016
Conference Location: Porto Alegre, Brazil
Conference Date: 8 May 2016
Page(s): 45 - 46
ISBN (Electronic): 978-1-4673-9007-1
DOI: 10.1109/ASYNC.2016.12
Regular:

The increasing scale and complexity of integrated circuits leads to many departures from a pure, synchronous design methodology. Clock-domain crossings, multi-cycle paths, and circuits for test... View More

Advertisement