IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis for errors of shunt outrange measurement based on finite element method

2016 IEEE International Conference on Computational Electromagnetics (ICCEM)

Author(s): Rundong Han ; Qi Wang ; Tianzheng Wang ; Xiaojing Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Conference Location: Guangzhou, China
Conference Date: 23 February 2016
Page(s): 7 - 9
ISBN (Electronic): 978-1-4673-9678-3
DOI: 10.1109/COMPEM.2016.7588665
Regular:

Thermoelectric coupling finite element model of 150A/75mV shunt was established, and temperature rises of them when the measuring current was over range were analyzed. Electromagnetic finite... View More

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