IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simulation analysis of reliability in primary storage deduplication

2016 IEEE International Symposium on Workload Characterization (IISWC)

Author(s): Min Fu ; Patrick P. C. Lee ; Dan Feng ; Zuoning Chen ; Yu Xiao
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Providence, RI, USA
Conference Date: 25 September 2016
Page(s): 1 - 10
ISBN (CD): 978-1-5090-3895-4
ISBN (Electronic): 978-1-5090-3896-1
DOI: 10.1109/IISWC.2016.7581280
Regular:

Deduplication has been widely used to improve storage efficiency in modern primary and secondary storage systems, yet how deduplication fundamentally affects storage system reliability remains... View More

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