IEEE - Institute of Electrical and Electronics Engineers, Inc. - SPEC-AX and PARSEC-AX: extracting accelerator benchmarks from microprocessor benchmarks

2016 IEEE International Symposium on Workload Characterization (IISWC)

Author(s): Snehasish Kumar ; William N. Sumner ; Arrvindh Shriraman
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Providence, RI, USA
Conference Date: 25 September 2016
Page(s): 1 - 11
ISBN (CD): 978-1-5090-3895-4
ISBN (Electronic): 978-1-5090-3896-1
DOI: 10.1109/IISWC.2016.7581272
Regular:

The end of Dennard Scaling has necessitated research into the adoption of specialized architectures for offloading specific code regions in applications. Recent works in accelerator architectures... View More

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