IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computational problems in automatized reliability analysis based on fault tree

2016 XIth International Scientific and Technical Conference on Computer Sciences and Information Technologies (CSIT)

Author(s): Tetyana Stefanovych ; Serhiy Shcherbovskykh
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Lviv, Ukraine
Conference Date: 6 September 2016
Page(s): 149 - 151
ISBN (Electronic): 978-1-5090-2740-8
DOI: 10.1109/STC-CSIT.2016.7589892
Regular:

The automatized reliability analysis technique based on fault tree is given. Using this technique for fault trees based on OR-gates and AND-gates structures the research are done. It is shown what... View More

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