IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fast verification method for timing related faults by forming special testbench group on critical paths in simulation

2016 IEEE 11th Conference on Industrial Electronics and Applications (ICIEA)

Author(s): Can Gao ; Ligang Hou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Hefei, China, China
Conference Date: 5 June 2016
Page(s): 1,828 - 1,831
ISBN (Electronic): 978-1-4673-8644-9
ISBN (USB): 978-1-5090-2605-0
ISSN (Electronic): 2158-2297
DOI: 10.1109/ICIEA.2016.7603884
Regular:

By using HDCP engineering code as a verification prototype, the critical path was identified and extracted from timing path report. The gate monitoring report could be getting from monitoring... View More

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