IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of multi-DOF error based on microvision for optical fiber assembly

2016 IEEE 11th Conference on Industrial Electronics and Applications (ICIEA)

Author(s): Fei Yu ; Weihai Chen ; Haosong Yue ; Jianbin Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Hefei, China
Conference Date: 5 June 2016
Page(s): 1,666 - 1,670
ISBN (Electronic): 978-1-4673-8644-9
ISBN (USB): 978-1-5090-2605-0
ISSN (Electronic): 2158-2297
DOI: 10.1109/ICIEA.2016.7603853
Regular:

Measurement based on micro-vision is an important part of micro assembly. In order to accurately control the manipulator to complete the optical fiber assembly, it's necessary to measure the... View More

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