IEEE - Institute of Electrical and Electronics Engineers, Inc. - Biased-sampling of density-based local outlier detection algorithm

2016 12th International Conference on Natural Computation, Fuzzy Systems and Knowledge Discovery (ICNC-FSKD)

Author(s): Peiguo Fu ; Xiaohui Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Conference Location: Changsha, China
Conference Date: 13 August 2016
Page(s): 1,246 - 1,253
ISBN (Electronic): 978-1-5090-4093-3
ISBN (USB): 978-1-5090-4092-6
DOI: 10.1109/FSKD.2016.7603357
Regular:

Anomaly detection is a hot research field in the area of machine learning and data mining. The current outlier mining approaches which are based on the distance or the nearest neighbor are... View More

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