IEEE - Institute of Electrical and Electronics Engineers, Inc. - Loopback test unit benefits

2016 IEEE AUTOTESTCON

Author(s): Patrick Cushing ; Sergio Gutierrez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Anaheim, CA, USA
Conference Date: 12 September 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-0790-5
ISSN (Electronic): 1558-4550
DOI: 10.1109/AUTEST.2016.7589625
Regular:

Failure in the Production test set can halt production and lead to extended downtime spent isolating the failure. Identifying a failure in a test set often relies on using a known good unit, or... View More

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