IEEE - Institute of Electrical and Electronics Engineers, Inc. - IEEE P1505.3™ Standard BAE manufacturing test interface implementation

2016 IEEE AUTOTESTCON

Author(s): Michael Stora ; Rob Spinner ; Steve Mann ; George Isabella ; David Droste ; Larry Adams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Anaheim, CA, USA
Conference Date: 12 September 2016
Page(s): 1 - 7
ISBN (Electronic): 978-1-5090-0790-5
ISSN (Electronic): 1558-4550
DOI: 10.1109/AUTEST.2016.7589622
Regular:

This paper provides an overview of a manufacturing test implementation by BAE Systems, utilizing the "IEEE-1505.3-2015 Universal Test Interface (UTI) Pin Map Configuration for... View More

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