IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tapping into boundary scan resources for vehicle health management

2016 IEEE AUTOTESTCON

Author(s): Louis Y. Ungar ; Michael D. Sudolsky
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Anaheim, CA, USA
Conference Date: 12 September 2016
Page(s): 1 - 10
ISBN (Electronic): 978-1-5090-0790-5
ISSN (Electronic): 1558-4550
DOI: 10.1109/AUTEST.2016.7589618
Regular:

Design for testability (DFT) should go beyond simply assisting manufacturing test or even beyond fielded unit troubleshooting. Boundary scanned components can be controlled to collect real time... View More

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