IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modern technologies are biting off more than our test systems can chew

2016 IEEE AUTOTESTCON

Author(s): Neil Baliga
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2016
Conference Location: Anaheim, CA, USA
Conference Date: 12 September 2016
Page(s): 1 - 7
ISBN (Electronic): 978-1-5090-0790-5
ISSN (Electronic): 1558-4550
DOI: 10.1109/AUTEST.2016.7589578
Regular:

Despite billions spent on software in testing aerospace and high technology products, companies are still struggling to keep up with Moore's law and shorter schedules. This results in excessive... View More

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