IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characteristics of a highly reliable amorphous silicon antifuse

2016 IEEE International Nanoelectronics Conference (INEC)

Author(s): Jianjun Li ; Wei Li ; Tao Du ; Xiaodong Xie
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2016
Conference Location: Chengdu, China
Conference Date: 9 May 2016
Page(s): 1 - 2
ISBN (Electronic): 978-1-4673-8969-3
ISSN (Electronic): 2159-3531
DOI: 10.1109/INEC.2016.7589354
Regular:

The α-Si:H antifuse is very promising for high-speed and high-density FPGA. A newly developed antifuse with the structure of Al/α-Si:H, N/α-Si:H/Al was prepared by surface treatment... View More

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