IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimization of EMC aerospace margins using re-sampling techniques with Monte Carlo simulations

2016 IEEE Metrology for Aerospace (MetroAeroSpace)

Author(s): Sebastien Lallechere ; Sebastien Girard ; Pierre Bonnet ; Francoise Paladian ; Chaouki Kasmi ; Jose Lopes ; Laurent Patier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Florence, Italy
Conference Date: 22 June 2016
Page(s): 161 - 165
ISBN (Electronic): 978-1-4673-8292-2
DOI: 10.1109/MetroAeroSpace.2016.7573205
Regular:

This contribution aims to illustrate the interest of re-sampling technique for accurate and efficient assessment of confidence intervals. Taking exhaustively into account uncertain inputs of... View More

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