IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability andSEE mitigation in memories for space applications

2016 IEEE Metrology for Aerospace (MetroAeroSpace)

Author(s): Enrico Petritoli ; Fabio Leccese
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Florence, Italy
Conference Date: 22 June 2016
Page(s): 136 - 140
ISBN (Electronic): 978-1-4673-8292-2
DOI: 10.1109/MetroAeroSpace.2016.7573200
Regular:

The paper shows the strategies of choice of recovery methods of the RAM when, in space environment, they are affected by various SEE phenomena. The article considers various recovery... View More

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