IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast Multi-level Test Generation at the RTL

2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

Author(s): Kelson Gent ; Michael S. Hsiao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2016
Conference Location: Pittsburgh, PA, USA
Conference Date: 11 July 2016
Page(s): 553 - 558
ISBN (Electronic): 978-1-4673-9039-2
ISSN (Electronic): 2159-3477
DOI: 10.1109/ISVLSI.2016.95
Regular:

Functional, at-speed vectors continue to provide added value to the testing community as circuit complexity rises. Complex defects may escape traditional scan vectors and thus often require... View More

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