IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parametric modeling of the coupling channel of conducted interference based on multi-linear regression model

2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Author(s): Shunxin Wang ; Fei Dai ; Tao Zheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2016
Conference Location: Beijing, China
Conference Date: 27 July 2016
Page(s): 1 - 2
ISBN (Electronic): 978-1-4673-8762-0
DOI: 10.1109/NEMO.2016.7561656
Regular:

In electromagnetic compatibility testing, the conducted electromagnetic emission (EMI) of the equipment under test (EUT) are required to meet certain standards of electromagnetic compatibility in... View More

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