IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic stress reduction and service life extension of electronic assemblies

2016 39th International Spring Seminar on Electronics Technology (ISSE)

Author(s): Marco Hartung ; Matthias Viehmann ; Mathias Nowottnick
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2016
Conference Location: Pilsen, Czech Republic
Conference Date: 18 May 2016
Page(s): 402 - 406
ISBN (Electronic): 978-1-5090-1389-0
ISSN (Electronic): 2161-2064
DOI: 10.1109/ISSE.2016.7563229
Regular:

The studies were aimed at proving that the service life of electronic assemblies can be extended through dynamic stress reduction. This objective could be reached with the aid of a... View More

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