IEEE - Institute of Electrical and Electronics Engineers, Inc. - Long-term monitoring of flicker and some other parameters of voltage quality

2016 IEEE 16th International Conference on Environment and Electrical Engineering (EEEIC)

Author(s): Petr Krejci ; Pavel Santarius ; Radomir Gono ; Zdenek Brunclik
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Conference Location: Florence, Italy
Conference Date: 7 June 2016
Page(s): 1 - 6
ISBN (CD): 978-1-5090-2319-6
ISBN (Electronic): 978-1-5090-2320-2
DOI: 10.1109/EEEIC.2016.7555818
Regular:

In 1997 cooperation began between the Faculty of Electrical Engineering and Computer Science and the power company CEZ on a joint project that involved monitoring selected voltage quality... View More

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