IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empirical insight into the context of design patterns: Modularity analysis

2016 7th International Conference on Computer Science and Information Technology (CSIT)

Author(s): Mawal Mohammed ; Mahmoud Elish ; Abdallah Qusef
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2016
Conference Location: Amman, Jordan
Conference Date: 13 July 2016
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-8914-3
DOI: 10.1109/CSIT.2016.7549474
Regular:

Design patterns are common solutions to specific design problems. There are many claimed benefits of the application of design patterns on design quality. This paper empirically evaluates and... View More

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