IEEE - Institute of Electrical and Electronics Engineers, Inc. - Outage probability of spatial modulation with antenna selection in Nakagami-m channel

2016 24th Signal Processing and Communication Application Conference (SIU)

Author(s): Ferhat Yarkin ; Ibrahim Altunbas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2016
Conference Location: Zonguldak, Turkey
Conference Date: 16 May 2016
Page(s): 885 - 888
ISBN (Electronic): 978-1-5090-1679-2
ISBN (USB): 978-1-5090-1678-5
DOI: 10.1109/SIU.2016.7495882
Regular:

In this paper, outage probability analysis of spatial modulation with capacity optimized antenna selection is studied in Nakagami-m fading channel model. At first, we obtain probability density... View More

Advertisement