IEEE - Institute of Electrical and Electronics Engineers, Inc. - 3D shape correspondence under topological noise

2016 24th Signal Processing and Communication Application Conference (SIU)

Author(s): Asli Genctav ; Yusuf Sahillioglu ; Sibel Tari
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2016
Conference Location: Zonguldak, Turkey
Conference Date: 16 May 2016
Page(s): 401 - 404
ISBN (Electronic): 978-1-5090-1679-2
ISBN (USB): 978-1-5090-1678-5
DOI: 10.1109/SIU.2016.7495762
Regular:

In this work, we present a new approach for the problem of 3D shape correspondence under topological noise. Topological noise can be easily encountered in 3D models acquired by various ways such... View More

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