IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quality-driven disorder handling for m-way sliding window stream joins

2016 IEEE 32nd International Conference on Data Engineering (ICDE)

Author(s): Yuanzhen Ji ; Jun Sun ; Anisoara Nica ; Zbigniew Jerzak ; Gregor Hackenbroich ; Christof Fetzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2016
Conference Location: Helsinki, Finland
Conference Date: 16 May 2016
Page(s): 493 - 504
ISBN (Electronic): 978-1-5090-2020-1
DOI: 10.1109/ICDE.2016.7498265
Regular:

Sliding window join is one of the most important operators for stream applications. To produce high quality join results, a stream processing system must deal with the ubiquitous disorder within... View More

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