IEEE - Institute of Electrical and Electronics Engineers, Inc. - A framework for multi-angle TIRF microscope calibration

2016 IEEE 13th International Symposium on Biomedical Imaging (ISBI)

Author(s): Emmanuel Soubies ; Sebastien Schaub ; Agata Radwanska ; Ellen Van Obberghen-Schilling ; Laure Blanc-Feraud ; Gilles Aubert
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2016
Conference Location: Prague, Czech Republic
Conference Date: 13 April 2016
Page(s): 668 - 671
ISBN (Electronic): 978-1-4799-2349-6
ISSN (Electronic): 1945-8452
DOI: 10.1109/ISBI.2016.7493355
Regular:

This communication presents a pipeline for Multi-Angle TIRF calibration from the measurement of the incident angle to the model validation. This problem is of major importance when dealing with 3D... View More

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