IEEE - Institute of Electrical and Electronics Engineers, Inc. - Visualization for the Assessment Model of an Simplified Test Maturity Model (TMM)

2016 International Conference on Platform Technology and Service (PlatCon)

Author(s): Woo Sung Jang ; R. Young Chul Kim ; Bo Kyung Park ; C. R. Carlson ; Ki Du Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Conference Location: Jeju, South Korea
Conference Date: 15 February 2016
Page(s): 1 - 4
ISBN (CD): 978-1-4673-8684-5
ISBN (Electronic): 978-1-4673-8685-2
DOI: 10.1109/PlatCon.2016.7456841
Regular:

For enhancing the test quality, it is required to something how to improve Test Maturity Model (TMM). However, the existing TMM has some inappropriate parts to apply TMM in domestic small and... View More

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