IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Study on Efficient Log Visualization Using D3 Component against APT: How to Visualize Security Logs Efficiently?

2016 International Conference on Platform Technology and Service (PlatCon)

Author(s): Jaehee Lee ; Jinhyeok Jeon ; Changyeob Lee ; Junbeom Lee ; Jaebin Cho ; Kyungho Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2016
Conference Location: Jeju, South Korea
Conference Date: 15 February 2016
Page(s): 1 - 6
ISBN (CD): 978-1-4673-8684-5
ISBN (Electronic): 978-1-4673-8685-2
DOI: 10.1109/PlatCon.2016.7456778
Regular:

APT attack has caused chaos in society since 2006. Especially, the vulnerability of the infrastructure is exposed to the outside a lot due to the development of the IT infrastructure in Korea. In... View More

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