IEEE - Institute of Electrical and Electronics Engineers, Inc. - Closing the Loop: Evaluating a Measurement Instrument for Maturity Model Design

2016 49th Hawaii International Conference on System Sciences (HICSS)

Author(s): David Raber ; Johannes Epple ; Robert Winter ; Marcus Rothenberger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Koloa, HI, USA
Conference Date: 5 January 2016
Page(s): 4,444 - 4,453
ISBN (Electronic): 978-0-7695-5670-3
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2016.553
Regular:

To support the systematic improvement of business intelligence (BI) in organizations, we have designed and refined a BI maturity model (BIMM) and a respective measurement instrument (MI) in prior... View More

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