IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Dominik Erb ; Karsten Scheibler ; Michael A. Kochte ; Matthias Sauer ; Hans-Joachim Wunderlich ; Bernd Becker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 749 - 754
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428101
Regular:

Unknown (X) values in a design introduce pessimism in conventional test generation algorithms, which results in a loss of fault coverage. This pessimism is reduced by a more accurate modeling and... View More

Advertisement