IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assessing CPA resistance of AES with different fault tolerance mechanisms

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Hoda Pahlevanzadeh ; Jaya Dofe ; Qiaoyan Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 661 - 666
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428087
Regular:

Countermeasures for Advanced Encryption Standard (AES) to thwart side-channel attack and fault attack are typically investigated in a separate fashion. There is lack of thorough investigation on... View More

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