IEEE - Institute of Electrical and Electronics Engineers, Inc. - Work hard, sleep well - Avoid irreversible IC wearout with proactive rejuvenation

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Xinfei Guo ; Mircea R. Stan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 649 - 654
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428085
Regular:

Various wearout mechanisms have both a reversible and an irreversible (permanent) part, with some, like BTI and EM having a significant reversible part, while others, like HCI, being mostly... View More

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