IEEE - Institute of Electrical and Electronics Engineers, Inc. - To Detect, Locate, and Mask Hardware Trojans in digital circuits by reverse engineering and functional ECO

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Xing Wei ; Yi Diao ; Yu-Liang Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 623 - 630
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428081
Regular:

During the EDA process, a design may be tampered directly by dishonest engineers (or "industry spy"), or may be tampered indirectly through the use of malicious modules from a third party... View More

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